1. 奈米材料檢測
2. 奈米元件開發
3. 高科技機台研發

從奈米線、奈米顆粒，到奈米片的 (光) 電性量測，包括傳輸性質與電子結構。實驗室有各式顯微鏡，檢測新穎奈米材料。此外，是少數能自製儀器進入商業化銷售市場的高科技機台研發實驗室。

1. Y. F. Lin,* C. H. Chang, T. C. Hung, W. B. Jian,* K. Tsukagoshi, Y. H. Wu, L. Chang, Z. Liu & J. Fang, “Nanocontact Disorder in Nanoelectronics for Modulation of Light and Gas Sensitivities”, Scientific Report 5, 13035 (2015).
2. S. J. Zou, S. T. Wang, M. F. Wu, W. B. Jian, and S. J. Cheng,* “Exposure of the Hidden Anti-ferromagnetism in Paramagnetic CdSe:Mn Nanocrystals”, ACS Nano 9, 503 (2015).
3. Y. F. Lin,* Y. Xu, S. T. Wang, S. L. Li, M. Yamamoto, A. Aparecido-Ferreira, W. Li, H. Sun, S. Nakaharai, W. B. Jian, K. Ueno, and K. Tsukagoshi,* “Ambipolar MoTe2 Transistors and Their Applications in Logic Circuits”, Adv. Mater. 26, 3263 (2014).
4. H. L. Chu, S. C. Chiu, C. F. Sung, W. Tseng, Y. C. Chang, W. B. Jian,* Y. C. Chen,* C. J. Yuan, H. Y. Li, F. X. Gu, M. Di Ventra, and C. C. Chang,* “Programmable Redox State of the Nickel Ion Chain in DNA”, Nano Lett. 14, 1026 (2014).
5. S. C. Chiu, J. S. Jhang, Y. F. Lin, S. Y. Hsu, J. Fang, and W. B. Jian,* “Nanocrystal shape and nanojunction effects on electron transport in nanocrystal-assembled bulks”, Nanoscale 5, 8555 (2013).